Magnetic Method (F-type probe) When the probe contacts the cover layer, the probe and magnetic substrate forms a closed magnetic circuit; Due to the presence of non-magnetic coating, magnetic resistance changes. The thickness of the cover layer can be derived by measuring the change. Eddy Current Method (NF-type probe) When the probe contacts the cover layer, the probe and non-magnetic substrate forms Eddy Current and gives feedback to the coil inside the probe. The thickness of the cover layer can be derived by measuring the feedback. Model WH81 & WH82 Principle Magnetic Method (F-type probe) & Eddy Current Method (NF-type probe) Range 0-1250um Accuracy error zero calibration ± (1 + 3% H); two-point calibration ± [(1% ~ 3% H)] H + 1.5 Power 2 * AA battery Unit Um/mil Temperature 0-40 ℃ humidity ≤85% Minimum substrate 10 * 10mm Minimum curvature 5mm convex; 5mm concave Thinnest substrate 0.4mm Weight 3.49oz(99g) Size 4.33in * 2.55in * 1.18in(110mm * 65mm * 30mm) Package include: Meter device * 1 Standard films * 5 Base substrate * 1/2 5 dry cell * 2 Packing box * 1 User Manual * 1
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